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Semiconductor Junctions, TU Delft
The Elements of Statistical Leaming Data Mining, Inference, and Prediction.
慶應大学講義 半導体工学
Paul R. Gray, Paul J. Hurst, Stephen H. Lewis, Robert G. Meyer: Analysis And Design Of Analog Integrated Circuits
Semiconductor Junctions, TU Delft
OCWの電子計測関連
キッテル固体物理学入門
Donald Peter, Seattle Pacific University: AC 2007-1362: WE CAN DO BETTER: A PROVEN, INTUITIVE, EFFICIENT AND PRACTICAL DESIGN-ORIENTED CIRCUIT ANALYSIS PARADIGM IS AVAILABLE, SO WHY AREN'T WE USING IT TO TEACH OUR STUDENTS?
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